Mass-Thickness Measurements in the Transmission Electron Microscope

A Single-Standard Approach to Quantitative EDS AnalysisQuantitative EDS in the TEM via Mass-Thickness Measurements

  • Zega, Thomas J
  • Howe, Jane Y
  • Schrader, Devin L
  • Sagar, James
  • Pinard, Philippe
  • Marks, Sam
Microscopy and Microanalysis 31(2), April 2025. | DOI: 10.1093/mam/ozaf005
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